Last edited by Sarisar
Friday, November 6, 2020 | History

2 edition of Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys found in the catalog.

Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys

Albert J Weigand

Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys

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  • 26 Currently reading

Published by National Aeronautics and Space Administration, Scientific and Technical Information Office, for sale by the National Technical Information Service in Washington, Springfield, Va .
Written in English

    Subjects:
  • Sputtering (Physics),
  • Biomedical engineering

  • Edition Notes

    StatementAlbert J. Weigand, M. Lise Meyer, and Jerri S. Ling
    SeriesNASA technical memorandum ; NASA TM X-3553, NASA technical memorandum -- NASA TM X-3553
    ContributionsMeyer, M Lise, joint author, Ling, Jerri S., joint author, United States. National Aeronautics and Space Administration
    The Physical Object
    Pagination31 p. :
    Number of Pages31
    ID Numbers
    Open LibraryOL14927267M


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Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys by Albert J Weigand Download PDF EPUB FB2