2 edition of Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys found in the catalog.
Scanning-electron-microscopy observations and mechanical characteristics of ion-beam-sputtered surgical implant aloys
Albert J Weigand
1977 by National Aeronautics and Space Administration, Scientific and Technical Information Office, for sale by the National Technical Information Service in Washington, Springfield, Va .
Written in English
|Statement||Albert J. Weigand, M. Lise Meyer, and Jerri S. Ling|
|Series||NASA technical memorandum ; NASA TM X-3553, NASA technical memorandum -- NASA TM X-3553|
|Contributions||Meyer, M Lise, joint author, Ling, Jerri S., joint author, United States. National Aeronautics and Space Administration|
|The Physical Object|
|Pagination||31 p. :|
|Number of Pages||31|
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